JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD

JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD B. Tech III Year MATERIALS CHARACTERIZATION Previous Question Paper (February - 2023 - R18)

B. Tech | III Year | II Semester | R18 | February - 2023

Answer PaperPaper Code: 156BTMaximum Marks: 75Time: 3 Hours

Note: i) Question paper consists of Part A, Part B. ii) Part A is compulsory, which carries 25 marks. In Part A, Answer all questions. iii) In Part B, Answer any one question from each unit. Each question carries 10 marks and may have a, b as sub questions.

Part A

125 marks
a

What is called resolving power?

2 marks

Answer

Resolving power is the ability of an optical instrument to distinguish between two closely spaced objects as separate entities. It is defined by the minimum distance between two points at which they can still be perceived as distinct rather than a single blurred image.

b

How does the numerical aperture affect the resolution of a microscope?

3 marks

Answer

Numerical aperture (NA) is directly proportional to the resolution of a microscope. According to the Abbe diffraction limit, the resolution limit (d) is given by:

d = 0.61λ / NA

As the numerical aperture increases, the value of d decreases, meaning the microscope can resolve finer details. A higher NA allows the collection of more diffracted light, leading to a sharper and more detailed image.

c

What is depth of focus in SEM?

2 marks

Answer

Sign in to view the complete answer paper.

d

What are the applications of SEM?

3 marks

Answer

Sign in to view the complete answer paper.

e

How depth of field in TEM is defined?

2 marks

Answer

Sign in to view the complete answer paper.

f

Why are thin sections of specimen necessary in TEM?

3 marks

Answer

Sign in to view the complete answer paper.

g

Who has invented X-rays and when?

2 marks

Answer

Sign in to view the complete answer paper.

h

What is X-ray diffractometry?

3 marks

Answer

Sign in to view the complete answer paper.

i

What is Gibb’s phase rule?

2 marks

Answer

Sign in to view the complete answer paper.

j

What are different types of stresses present in materials when subjected to deformation? Explain.

3 marks

Answer

Sign in to view the complete answer paper.

Part B

210 marks
a

Explain the principle of phase contrast in optical microscopy.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain the image formation in light microscopy.

5 marks

Answer

Sign in to view the complete answer paper.

OR
3

Explain about quantitative metallography using optical microscope.

10 marks

Answer

Sign in to view the complete answer paper.

410 marks
a

Draw the line diagram of SEM and explain the functions of each component.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain the advantages and limitations of SEM.

5 marks

Answer

Sign in to view the complete answer paper.

OR
5

Explain the different methods of specimen preparation in SEM.

10 marks

Answer

Sign in to view the complete answer paper.

610 marks
a

Compare and contrast between TEM and SEM.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain about instrumentation of TEM.

5 marks

Answer

Sign in to view the complete answer paper.

OR
710 marks
a

Briefly discuss about image modes of TEM.

5 marks

Answer

Sign in to view the complete answer paper.

b

Briefly discuss about electron beam source and condenser lens in TEM.

5 marks

Answer

Sign in to view the complete answer paper.

810 marks
a

Show that short wavelength limit of a continuous spectrum depends only on the applied voltage.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain the factors on which the total intensity of the continuous spectrum depends.

5 marks

Answer

Sign in to view the complete answer paper.

OR
910 marks
a

Explain the order-disorder arrangements observed in FeNi3, MnNi3 etc with neat sketches.

5 marks

Answer

Sign in to view the complete answer paper.

b

Though CuZn is fully ordered the ratio of intensity of super lattice and fundamental lines is only 0.0003. Explain the necessary reasons. Explain the procedure how the value 0.0003 is arrived.

5 marks

Answer

Sign in to view the complete answer paper.

1010 marks
a

What is the smallest value of θ at which CrKα doublet will be resolved in a 5.73cm diameter Hull/Debye-Scherrer camera? Assume that the line width is 0.03cm and that the separation must be twice the width for resolution.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain about Guiner cameras.

5 marks

Answer

Sign in to view the complete answer paper.

OR
1110 marks
a

X-rays with a wavelength of 0.60A are used for calculating d200 in nickel. The reflecting angle is 9.50. Calculate the size of the unit cell.

5 marks

Answer

Sign in to view the complete answer paper.

b

Explain why diffraction lines with diffraction angle equal to 1800 give accurate lattice parameters.

5 marks

Answer

Sign in to view the complete answer paper.

About this paper

This page contains the question paper of MATERIALS CHARACTERIZATION from JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD for B. Tech MME-MMT III Year II Semester, February - 2023, R18.

For the solved question paper with answers, switch to the Answer Paper tab.

Other papers in MATERIALS CHARACTERIZATION

Loading Question Papers

Fetching data from database...