JNTU
JNTU B.Tech IV MATERIAL CHARACTERIZATION TECHNIQUES Previous Question Paper (November/December - 2018 - R15)
Note: This question paper contains two parts A and B. Part A is compulsory which carries 25 marks. Answer all questions in Part A. Part B consists of 5 Units. Answer any one full question from each unit. Each question carries 10 marks and may have a, b, c as sub questions.
Part A
Discuss the importance of Material characterization.
Answer
Material characterization is essential to establish the relationship between the processing, structure, properties, and performance of materials. It allows for the identification of chemical composition, phase distribution, and microstructural features, which are critical for quality control, failure analysis, and the development of new advanced materials.
How will you classify the techniques for material characterization?
Answer
Characterization techniques are generally classified based on the probe used and the interaction measured: 1) Imaging techniques (e.g., Optical Microscopy, SEM, TEM) for visualizing microstructure; 2) Diffraction techniques (e.g., XRD, LEED) for determining crystal structure; and 3) Spectroscopic techniques (e.g., EDS, XPS, Raman) for analyzing chemical composition and bonding states.
Explain Depth of Field and Depth of Focus.
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Define Diffraction and Interference.
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Write the properties of X-Rays.
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What are the factors affecting Diffraction intensities?
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What is Order-disorder transformation?
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Explain the Effect of plastic deformation.
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What is photoelectron spectroscopy?
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Explain the principle of Raman spectroscopy.
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Part B
Explain the Optical Design of the Phase Contrast Microscope with neat sketch.
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Explain the properties of polarized light.
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Enumerate the steps involved in specimen preparation in SEM.
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Explain the different modes used in SEM.
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List the advantages, limitations and applications of TEM.
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What is X-ray diffraction? How it is useful in material characterization? Explain briefly Laue method of diffraction. What are the advantages and disadvantages of Laue method?
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Explain the Intensity of diffracted beam.
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What are the factors affecting the diffraction intensities.
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Discuss Debye-Scherrer method for study of crystal structure.
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Explain stress measurement by XRD.
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Enumerate on phase diagram determination by XRD.
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With a neat sketch explain IR Spectrometer. List advantages, disadvantages and applications of IR analysis.
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What is FTIR? Explain its working principle and applications.
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