JNTU
JNTU B.Tech III CHARACTERIZATION OF NANOMATERIALS Previous Question Paper (December - 2018 - R15)
Note: This question paper contains two parts A and B. Part A is compulsory which carries 25 marks. Answer all questions in Part A. Part B consists of 5 Units. Answer any one full question from each unit. Each question carries 10 marks and may have a, b, c as sub questions.
Part A
Explain the main limitations of Electron Microscope.
Answer
The main limitations of electron microscopes are the requirement for high-vacuum conditions, which prevents the observation of living specimens, and the necessity for complex sample preparation, such as conductive coating for non-conductive materials to prevent charging effects.
Write the Principle of Optical microscope
Answer
The principle of an optical microscope relies on the use of visible light and a series of glass lenses to magnify small objects. Light passes through the specimen, and the objective lens forms a real, magnified intermediate image, which is then further magnified by the eyepiece to produce a virtual, enlarged image for the observer.
Explain about raster scan process
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What are the secondary electrons?
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Define Resolution with example
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Explain the concept of Bright field Imaging.
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Explain the principle of AFM.
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Write a short note on dimensions of AFM Tip.
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How diffraction differ from scattering and transmission?
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Define diffraction phenomena with example.
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Part B
Explain the significance of Electron lenses (Electrostatic and Electromagnetic) in the Electron Microscope.
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Explain the construction and working principle of Electron Microscope with neat sketch.
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Describe the construction, working principle, advantages and disadvantages of SEM.
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Explain Specimen-Beam interactions with neat sketch.
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Explain Biological sample preparation technique for SEM.
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Explain the Applications of TEM.
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How does the HRTEM differs from TEM?
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Explain the concept of Dark field imaging.
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Explain the principle of TEM.
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Draw a neat sketch of TEM instrument.
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Describe the advantages and disadvantages of TEM.
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Explain the concept of Tip functionalization.
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Explain the Force curves and force measurements of AFM.
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Describe the construction, advantages and disadvantages of AFM with a neat sketch.
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Explain the working principle and construction of UV Spectroscopy.
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Explain the working principle and construction of powder X-ray diffraction.
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Describe the Crystallite size analysis using Scherer formula and Williamson–Hall equation.
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Explain the working principle and construction of IR Spectroscopy.
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