B.Tech IV Year I Semester (R16)
The prime aim of this course is to explain the students the significance of
X-ray diffraction and its application in determination of crystal structure, lattice parameter, chemical analysis and stress measurement of the given system.
At the end of this course, the student will acquire knowledge on various
experimental methods of X-ray diffraction so that he/she can conduct his/her project work which may include characterization through X-ray Diffraction.
Introduction - Production and properties of x-rays; Stereographic projection; Bragg’s law of diffraction; Diffraction directions and diffraction methods; Intensity of Diffracted beams - Scattering by an electron, by an atom, by a unit cell; Structure-factor calculations; Factors to be considered in calculating the intensities.
Experimental Methods - Laue Photographs; Powder photographic methods - Debye- Scherrer methods, Focusing cameras, Pinhole photographs; Diffractometer measurements.
Applications - Orientation of single crystals - Laue method and Diffractometer method, Effect of plastic deformation; The Structure of Polycrystalline Aggregates - Crystal size, Crystal perfection, Crystal orientations.
Applications - Determination of crystal structure; Precise lattice parameter measurements; Phase - diagram determination; Order-disorder transformation; Stress measurement.
Applications - Chemical analysis - Qualitative analysis, Quantitative analysis.
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