JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD

Course Objectives:

• 1. To provide knowledge about top-down and bottom-up approaches for the synthesis of nanomaterials.
• 2. To enhance the various nanosynthesis techniques and to identify and solve problems
• 3. To design and conduct experiments relevant to nanochemistry, as well as to analyze the results.
• 4. To improve usage of synthesis methods for modern technology
• 5. To provide an overview of contemporary spectroscopy, microscopy, diffraction and analysis tools to characterize different properties of nanomaterials
• 6. To develop ability to understand modern characterization techniques especially utilized to probe in nanoscopic regime
• 7. To elucidate on application of standard spectroscopy, microscopy techniques for element analysis, structure analysis, depth profiling, topography imaging, as well as surface and interface analysis
• 8. To provide overview of principles underlying the characterization methods and basic theory for analysis of the data obtained from the instrument
• 9. To make the students understand the principles underlying various spectroscopies and instrumentations specific to nanomaterials

Course Outcome

To provide an abundant knowledge on various synthesis methods of

nanomaterials.

UNIT - I

Introduction, Bottom-up approach: Top-down: Sol-gel method, ball milling ,Physical methods: Inert gas condensation, Arc discharge, plasma synthesis, electric explosion of wires, molecular beam epitaxy, Physical Vapour Deposition, thermal evaporation, solution combustion synthesis, Chemical vapor deposition and sputtering, approach with examples.

UNIT - II

Chemical methods: Nanocrystals by chemical reduction, photochemical synthesis, electrochemical synthesis, Co-precipitation method. Semiconductor nanocrystals by arrested precipitation, sonochemical routes

UNIT - III

Fundamentals of Electron Microscopy: Scanning Electron Microscopy: SEM: Theory of operation, Specimen-Beam interactions Importance of beam spot size, Machine variables, Scanning Electron Microscope (SEM).

R16 B.TECH MSNT.

Transmission Electron Microscopy: TEM: Theory of operation, Modes of operation, Transmission Electron Microscope (TEM),Bright field Imaging, Electron diffraction, Dark field imaging, High Resolution TEM (HRTEM), Applications of TEM.

UNIT - IV

Atomic Force Microscopy: AFM: Basic concepts – Interactive forces, Principle and instrumentation, Force curves and force measurements, Modes of imaging: Tapping, contact and non-contact, Probes, Tip functionalization,

UNIT - V

X-Ray Diffraction and Spectroscopic methods: X-ray diffraction–Powder method, Single crystal diffraction technique -Determination of crystal structures – Nanostructural analysis – Profile analysis (peak broadening and micro strain) – Crystallite size analysis using Scherer formula and Williamson – Hall equation.

TEXT BOOKS:

• 1. Nanotechnology: Principles and Practices – Sulabha K. Kulkarni – Capital Publishing Company
• 2. 2. Nano: The Essentials – Understanding Nanoscience and Nanotechnology by T. Pradeep. Tata McGraw Hill
• 3. Introduction to Nano Technology by Charles. P. Poole Jr and Frank J. Owens, Wiley India Pvt. Ltd.
• 4. A practical approach to X-Ray diffraction analysis by C. Suryanarayana
• 5. Textbook of Nanoscience and Nanotechnology – B. S. Murthy, P. Shankar, Baldev Raj, B. B. Rath and James Murday, University Press-IIM Series in Metallurgy and Materials Science.
• 6. A Textbook of Nanoscience and Nanotechnology – T. Pradeep, Tata McGraw Hill edition.
• 7. Nanostructures and Nanomaterials by Guozhong Cao
• 8. Inorganic Materials Synthesis and Fabrication by J.N. Lalena, D.A. Cleary, E.E. Carpenter, N.F. Dean, John Wiley & Sons Inc.
• 9. Introduction to Nano Technology by Charles P. Poole Jr and Frank J. Owens. Wiley India Pvt Ltd.
• 10. The Chemistry of nanomaterials: Synthesis, Properties and Applications, Vol-I by C.N.R. Rao, A. Muller and A.K. Cheetham
• 11. The Physics of Micro/Nano- Fabrication by Ivor Brodie and Julius J. Muray

REFERENCES:

• 1. Haynes, R., Woodruff, D.P. and Talchar, T.A., Optical Microscopy of Materials・ Cambridge University press, 1986.
• 2. Flegler, S.L., Heckman, J.W. and Klomparens, K.L., Scanning and Transmission Electron Microscopy: An Introduction・ WH Freeman & Co, 1993. R16 B.TECH MSNT.
• 3. Paul E. West, Introduction to Atomic Force Microscopy Theory Practice Applications・
• 4. Julian ChenN, C., Introduction to Scanning Tunneling Microscopy・ Oxford University Press, Inc., 1993.
• 5. Magonov, S.M., and Whangbo, M-H., surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis・ VCH Publishers, Inc., New York 1996.
• 6. Goldstein, J., Newbury, D.E., Joy, D.C., and Lym, C.E., Scanning Electron Microscopy and X-ray Microanalysis・ 2003.
• 7. Encyclopedia of Nanotechnology by M. Balakrishna Rao and K. Krishna Reddy, Vol I to X, Campus books.
• 8. Encyclopedia of Nanotechnology by H.S. Nalwa
• 9. Nano: The Essentials – Understanding Nano Scinece and Nanotechnology – by T. Pradeep, Tata McGraw Hill R16 B.TECH MSNT.