JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD

Course Objectives:

• To develop ability to understand modern characterization techniques especially utilized to probe in nanoscopic regime
• To elucidate on application of standard spectroscopy, microscopy techniques for element analysis, structure analysis, depth profiling, topography imaging, as well as surface and interface analysis
• To provide overview of principles underlying the characterization methods and basic theory for analysis of the data obtained from the instrument
• The objective of this course is to make the students understand the principles underlying various spectroscopies and instrumentations specific to nanomaterials

UNIT - I

Fundamentals of Electron Microscopy: Advantages of Electron Microscope over Optical Microscope (Magnification, Resolution, Depth of field). Theory and principle of Electron Microscope, Electron sources, Electron lenses (Electrostatic and Electromagnetic).

UNIT - II

Scanning Electron Microscopy: SEM: Theory of operation, Specimen-Beam interactions Importance of beam spot size, Machine variables, Scanning Electron Microscope (SEM). Specimen Preparation in SEM: Special methods for various sample types – Biological sample preparation, Applications of SEM

UNIT - III

Transmission Electron Microscopy: TEM: Theory of operation, Modes of operation, Transmission Electron Microscope (TEM),Bright field Imaging, Electron diffraction, Dark field imaging, High Resolution TEM (HRTEM), Applications of TEM.

UNIT - IV

Atomic Force Microscopy: AFM: Basic concepts – Interactive forces, Principle and instrumentation, Force curves and force measurements, Modes of imaging: Tapping, contact and non-contact, Probes, Tip functionalization,

UNIT - V

X-Ray Diffraction and Spectroscopic methods:

R16 B.TECH AERONAUTICAL ENGG.

X-ray diffraction–Powder method, Single crystal diffraction technique -Determination of crystal strucures – Nanostructural analysis – Profile analysis (peak broadening and micro strain) – Crystallite size analysis using Scherer formula and Williamson – Hall equation. UV Spectroscopy, IR Spectroscopy and Raman Spectroscopy

TEXT BOOKS:

• 1. Nanotechnology: Principles and Practices – Sulabha K. Kulkarni – Capital Publishing Company
• 2. 2. Nano: The Essentials – Understanding Nanoscience and Nanotechnology by T. Pradeep. Tata McGraw Hill
• 3. 3. Introduction to Nano Technology by Charles. P. Poole Jr and Frank J. Owens, Wiley India Pvt Ltd.
• 4. A practical approach to X-Ray diffraction analysis by C. Suryanarayana

REFERENCES:

• 1. Haynes. R, Woodruff. D. P. and Talchar, T.A., optical Microscopy of Materials Cambridge University press, 1986.
• 2. Flegler, S.L., Heckman, J.W. and Klomparens, K.L., scanning and Transmission Electron Microscopy: A Introduction WH Freeman & Co, 1993.
• 3. Paul E. West, introduction to Atomic Force Microscopy Theory Practice Applications
• 4. Julian Chen N, C., introduction to Scanning Tunneling Microscopy, Oxford University Press, Inc., 1993.
• 5. Magonov, S.M., and Whangbo, M-H., surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis VCH Publishers, Inc., New York 1996.
• 6. Goldstein, J., Newbury, D.E., Joy, D.C., and Lym, C.E., scanning Electron Microscopy and X-ray Microanalysis, 2003. R16 B.TECH AERONAUTICAL ENGG. B.TECH. MECHANICAL ENGINEERING (MECHATRONICS)