JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD

Overview

Course objectives:

• 1. To obtain knowledge on various structural and microstructural characterization techniques of materials.
• 2. To study the principles, theory and practice of various characterization techniques

Course Outcomes

After completing this course the student will be able to:

• 1. Determine crystal structures of materials
• 2. Analyze microstructure of materials at different length scales
• 3. Analyze defects and fracture surfaces of the tested materials
• 4. Indicate instrumentation associated with and operating principles of various techniques

UNIT - I

Optical Microscopy: Principle, Image formation, Resolving power, Numerical aperture, Magnification, Depth of focus, Components of microscope, Important lens defects and their corrections, Resolving power and Magnification, Principle of phase contrast, Interference and Polarized light microscopy, Elements of quantitative, Metallography and Image processing.

UNIT - II

Scanning Electron Microscopy: Principle, Interaction of electron beams with matter, Construction and Working principle, Working Distance, Depth of field, Depth of focus and Spot Size, Specimen preparation, Different types of modes used in SEM (SE and BSE) and their applications, Advantages, limitations and applications.

UNIT - III

Transmission Electron Microscopy: Principle, Construction and Working principle, Resolving power and Magnification, Depth of field and Depth of focus, Bright and dark field, Specimen preparation, Selected area diffraction (SAD), Applications, Advantage and Limitations.

UNIT - IV

X-Ray Diffraction: Introduction, Production and properties of x-rays, Bragg’s law of diffraction, Experimental methods, Intensity of diffracted beams - Scattering by an electron by an atom, by a unit cell, structure-factor calculations, factors affecting diffraction intensities.

UNIT - V

Applications of XRD: Orientation of single crystals, Effect of plastic deformation, the structure of polycrystalline Aggregates, Determination of crystal structure, Precise lattice parameter measurements, Phase - diagram determination, Order-disorder transformation, Chemical analysis by Diffraction, Stress measurement.

TEXT BOOKS:

• 1. Material Characterization: Introduction to Microscopic and Spectroscopic Methods – Yang Lang – John Wiley & Sons (Asia) Pvt. Ltd. 2008
• 2. Microstructural Characterization of Materials – David Brandon, Wayne D Kalpan, John their applications, Advantages, limitations and applications.

REFERENCE BOOKS:

• 1. The Principles of Metallographic Laboratory and Practices (Metallurgy) – George L. Khel- McGraw- Hill, 1949. R18 B.TECH MME III YEAR
• 2. Experimental Techniques in Materials and Mechanics – C. Suryanarayana, CRC Press, Taylor & Francis Group, 2011.
• 3. Metallography: Principles and Practices – George F. Vander Voort, ASM International, 1984 – Technology & Engineering
• 4. Elements of X-ray diffraction – Bernard Dennis Cullity & Stuart R Stocks, Prentice Hall, 2001 – Science. R18 B.TECH MME III YEAR