M.Tech I Year II Semester (R19)
Elements of Probability Theory, Probability Distributions: Random variables, density and distribution functions, Mathematical expectation, Binominal distribution, Poisson distribution, Normal distribution, Exponential distribution, Weibull distribution. Reliability: Definition of Reliability, Significance of the terms appearing in the definition, Component reliability, Hazard rate, Derivation of the reliability functions in terms of the hazard rate, Hazard models.
Failures: Causes of failures, Types of failures (early failures, chance failures and wear-out failures), Modes of failure, Bath tub curve, Effect of preventive maintenance. Measures of Reliability: Mean Time to Failure (MTTF) and Mean Time between Failures (MTBF).
Reliability Logic Diagrams (reliability block diagrams): Classification of engineering systems Series, Parallel, Series-Parallel, Parallel-Series and non-series-parallel configurations (mainly for Electronic system configurations), Expressions for the reliability of the basic (Electronic Systems) configurations.
Reliability Evaluation of Non-Series-Parallel Configurations (Mainly for Electronic Systems Configurations): Minimal tie-set, Minimal cut-set and decomposition methods, Deduction of the minimal cut sets from the minimal path sets. More than Two Components Electronics Systems Reliability Evaluation: Series systems, Parallel systems with two and more than two components, Network reduction techniques, Minimal cutest / failure mode approach.
Discrete Markov Chains: General modelling concepts, Stochastic transitional probability matrix, Aime dependent probability evaluation and limiting state probability evaluation, absorbing states (mainly for Electronic systems). Continuous Markov Processes: Modelling concepts, State space diagrams, Stochastic Transitional Probability Matrix, Evaluating limiting state Probabilities, Reliability evaluation of repairable systems (mainly for Electronic systems).
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