Jawaharlal Nehru Technological University Hyderabad
Jawaharlal Nehru Technological University Hyderabad B.Tech III CHARACTERIZATION OF NANOMATERIALS Previous Question Paper (April - 2018 - R15)
Note: This question paper contains two parts A and B. Part A is compulsory which carries 25 marks. Answer all questions in Part A. Part B consists of 5 Units. Answer any one full question from each unit. Each question carries 10 marks and may have a, b, c as sub questions.
Part A
Define resolving power of an instrument.
Answer
The resolving power of an instrument is its ability to distinguish between two closely spaced objects as separate entities. It is defined as the minimum distance between two points at which they can still be perceived as distinct, often determined by the wavelength of the radiation used and the numerical aperture of the objective lens.
Mention the uses of electron microscope.
Answer
Electron microscopes are used for: 1) Imaging the morphology and topography of nanomaterials at high magnification. 2) Determining the crystalline structure and phase identification of samples through diffraction patterns. 3) Performing elemental analysis using energy-dispersive X-ray spectroscopy (EDS) to identify chemical composition.
What is the relationship between focus and electron beam spot in electron microscopy?
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Write short notes about two kinds of electrons coming out from the sample in a Scanning Electron Microscope.
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List the applications of Transmission electron microscopy.
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Define: bright field image and dark field image.
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Name the three different modes of operation in atomic force microscope.
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Explain the calculation of interactive forces between atoms in atomic force microscopy.
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Define atomic scattering factor.
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What is the principle of operation and uses of UV spectroscopy?
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Part B
Explain the advantages and limitations of electron microscope.
Discuss the construction and working principle of electrostatic lens in detail.
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With a neat sketch, explain the theory and working principle of electron microscope.
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Describe the various imaging modes used in scanning electron microscopy.
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Explain the preparative procedures for the in – situ chemical analysis of biological specimens in the scanning electron microscopy.
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With a neat sketch, describe the basic components and operations of transmission electron microscope.
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Explain the characteristics of fast Fourier transform diffraction – pattern – type image produced by transmission electron microscope.
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What is the operating principle of “high resolution transmission electron microscope”?
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Discuss the principle of operation and instrumentation used for atomic force microscope with a sketch.
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What is force curve? Explain the measurement and structure of a force curve.
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With a schematic diagram of X-ray diffractometer, discuss the analysis of a crystal structure.
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Explain the principle of the analysis of molecules by using Raman Spectroscopy with a schematic diagram.
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